Results of the surface morphology study of elastic self-adhesive radiation shielding coatings by atomic force microscopy

Авторы:
M.E. Buzoverya Y.P. Scherbak Vasiliy Cherkasov Yuriy Yurkin Valeriy Avdonin Dmitrii Suntsov V.O. Pilshchikov
Аннотация:

An algorithm for studying the structure of radiation shielding materials using the atomic force microscopy (AFM) method has been developed and described. Using the proposed method, the structure of tungsten-containing radiation shielding materials was studied and the difference in the microstructure of the samples and the nature of the distribution of the filler was revealed.