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<article article-type="research-article" dtd-version="1.3" xml:lang="ru">
  <front xmlns:xlink="http://www.w3.org/1999/xlink">
    <journal-meta>
      <journal-id journal-id-type="elibrary">https://www.elibrary.ru/title_about_new.asp?i</journal-id>
      <journal-title-group>
        <journal-title>Materials physics and mechanics</journal-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Механика и физика материалов</trans-title>
        </trans-title-group>
      </journal-title-group>
      <issn pub-type="epub">1605-8119</issn>
    </journal-meta>
    <article-meta xmlns:xlink="http://www.w3.org/1999/xlink">
      <article-id pub-id-type="publisher-id">8</article-id>
      <title-group>
        <article-title>Modeling of Size Effect on Dielectric Response of Thin Ferroelectric Films</article-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Modeling of Size Effect on Dielectric Response of Thin Ferroelectric Films</trans-title>
        </trans-title-group>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <name>
            <surname>Vendik</surname>
            <given-names>O.G.</given-names>
          </name>
          <xref ref-type="aff" rid="aff1"/>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Zubko</surname>
            <given-names>S.P.</given-names>
          </name>
          <xref ref-type="aff" rid="aff1"/>
        </contrib>
      </contrib-group>
      <aff id="aff1">Electrotechnical University</aff>
      <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2000-12-05">
        <day>05</day>
        <month>12</month>
        <year>2000</year>
      </pub-date>
      <volume>1</volume>
      <issue>1</issue>
      <fpage>45</fpage>
      <lpage>48</lpage>
      <self-uri xmlns:xlink="http://www.w3.org/1999/xlink" content-type="pdf" xlink:href="https://mpm.spbstu.ru/userfiles/files/2000_1_1_p8.pdf"/>
      <abstract xml:lang="en">
        <p>The size effect in thin film sandwich structures is considered. Three types of boundary conditions for dynamic polarization at interface electrode-ferroelectric layer are formulated. The type of boundary conditions depends on matching crystal lattices of electrodes and ferroelectric layer. A model describing the dependence of dielectric permittivity on biasing field, temperature, and thickness of the thin ferroelectric film is proposed. The results of the simulation are in good agreement with experiments.</p>
      </abstract>
      <kwd-group xml:lang="en">
        <kwd>Modeling of Size Effect</kwd>
        <kwd>Ferroelectric Films</kwd>
      </kwd-group>
    </article-meta>
  </front>
</article>
