Physical and information parameters of nanoscale electronic elements as a part of computing systems with neural network architecture

Problem of ensuring specified reliability indices when designing computation components of the telecommunication systems built via use of a nanoscale electronic element base is considered. Computer models of the computation components with neural network architecture and integrated nanoscale titanium oxide-based memristors and nanoscale graphene-based field-effect transistors are studied. Correlation between the physical and information parameters, integrated into the system of nanoscale electronic elements, as well as an impact of parameter variation on the system reliability, has been investigated.