MPM
Materials physics and mechanics Peter the Great St. Petersburg Polytechnic University
Since 2000
ISSN 1605-8119
en Английский
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Author Shtelmah
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Shtelmah
Shtelmah
Affiliation
Giricond, JSC
St.Petersburg, Russia

Use of X-ray analysis for conducting input and process control of electronics materials

Matvienko A.N. Sergey P. Teslenko Svetlana V. Shtelmah
  • Year: 2019
  • Volume: 41
  • Issue: 1
  • 8
  • 1785
  • Pages: 84-87