MPM
Materials physics and mechanics Peter the Great St. Petersburg Polytechnic University
Since 2000
ISSN 1605-8119
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Articles by keywords "scanning electron microscope analysis"

Polymer weld characterization and defect detection through advanced image processing techniques

Ganesha G.C. Mukti C. Arungalai Vendan S. Sharanabasavaraj R.
  • Year: 2025
  • Volume: 53
  • Issue: 3
  • 21
  • 307
  • Pages: 48-68