MPM
    Materials physics and mechanicsPeter the Great St. Petersburg Polytechnic University
    Since 2000
    ISSN 1605-8119
    enАнглийский
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    AuthorH.B. Pavagadhi
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    H.B. Pavagadhi
    H.B. Pavagadhi
    Affiliation
    Gujarat University
    Ahmedabad, India

    Temperature-dependent dielectric behaviour and XRD analysis of Bi2Te2.8Se0.2

    Pandya T.P.Jani M.P.Vyas S.M.Pavagadhi H.B.
    • Year: 2026
    • Volume: 54
    • Issue: 2
    • 44
    • 817
    • Pages: 101-110