MPM
    Materials physics and mechanicsPeter the Great St. Petersburg Polytechnic University
    Since 2000
    ISSN 1605-8119
    enАнглийский
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    AuthorMisal
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    Misal
    Misal
    Affiliation
    Kumar Swami College
    India

    Comparative study of structural, morphological and optical characterization of CdS, CdAlS and CdAlS annealed thin films

    L.S. RavangaveS.D. MisalU.V. BiradarK.N. Rothod
    • Year: 2012
    • Volume: 14
    • Issue: 2
    • 2
    • 2227
    • Pages: 129-136