MPM
Materials physics and mechanics Peter the Great St. Petersburg Polytechnic University
Since 2000
ISSN 1605-8119
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Author K.N. Rothod
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K.N. Rothod
  • Affiliation
    Dayanand Science College
  • India

Comparative study of structural, morphological and optical characterization of CdS, CdAlS and CdAlS annealed thin films

L.S. Ravangave S.D. Misal U.V. Biradar K.N. Rothod
  • Year: 2012
  • Volume: 14
  • Issue: 2
  • 1
  • 916
  • Pages: 129-136