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Sharkov
Affiliation
Ioffe Institute
St.Petersburg, Russia
Growth of SiC films by the method of substitution of atoms on porous Si (100) and (111) substrates
- Year: 2018
- Volume: 36
- Issue: 1
- 48
- 2963
- Pages: 39-52
The analysis of the etch pits parameters in the (-201) plane of the β-Ga2O3 substrate crystals
- Year: 2023
- Volume: 51
- Issue: 3
- 38
- 1441
- Pages: 46-51
Tribological characteristics of bulk (-201) β-Ga2O3 substrate crystals grown by EFG
- Year: 2023
- Volume: 51
- Issue: 6
- 37
- 1404
- Pages: 135-144